W2: Exploring Integrated Voltage References for Space Missions (and Other Harsh Environments)
Umberto Gatti, RedCat Devices
Abstract: In some environments such as space and avionics, it is required that the electronic components have a certain level of radiation hardness, in terms of Total Ionizing Dose (TID) and Single Event Effects (SEE). Moreover, operation temperatures could be extreme (at least in the military extended range), as well. The various requirements, issues and solutions related to the design of integrated voltage references for such applications are discussed in this tutorial. It is shown that by using standard CMOS and BiCMOS technologies (from 180nm down to 65nm) and a Radiation-Hardened-By-Design (RHBD) approach at circuital and layout levels it is possible to design voltage references capable to support high doses (up to 1Mrad), while SiGe HBT can be a benefit for very low temperatures (down to -200°C). A couple of test cases are finally presented in detail, together with the issue related to the test techniques under radiations, namely Gamma Ray, Protons and Heavy Ions.
Dr. Umberto Gatti was born in Pavia (Italy) in 1962. He received the Laurea degree in electronic engineering (summa cum laude) and the Ph.D. degree in Electronics and Information Engineering from the University of Pavia, Pavia, Italy, in 1987, and 1992, respectively. From 1993 to 1999, he worked in the R&D Lab, Italtel, Milan, Italy, as an ASIC Designer, being mainly involved modeling and design of analog ICs. In 1999, he joined the Development Technologies Lab, Siemens, Milan, Italy, where he was a Sr. Design ASIC Engineer. Besides developing analog ICs for telecommunication, during this period he was the company coordinator for the project ANASTASIA (1999-2003) funded under the framework of Eureka-Medea+ and focused on the design and test of high-speed sigma-delta converters. In 2008 he moved to Nokia Siemens Networks where he was a Sr. Power Supply Architect. The activity in Nokia included the analysis of power supply architectures for communication equipments and the coordination of products developed by external partners. Since 2012 he is with RedCat Devices (www.redcatdevices.it) as Sr. Microelectronic Engineer (member of the Executive Staff) and also hold co-operation with the University of Pavia. During his career he was involved in the design of high-speed data converters, in the design of broadband wireless transceivers, in the design of Hall sensors micro-systems in the signal integrity analysis of complex PCBs and in the design of power supply for telecom applications. His current research interests are in the area of CMOS integrated circuits for mixed-signal processing, in particular in rad-hard libraries and memories (SRAMs and OTP NVM), in rad-hard mixed-signal circuits (such as ADC-DAC) and in the testing techniques for rad-hard components. He holds 2 international patents and is co-author of about 60 papers. He is Senior Member of IEEE and serves also as reviewer for magazines and conferences.